
Precision Marking and Lift-Out Techniques for Advanced Failure Analysis and Sample Preparation
As semiconductor devices, electronic components, and advanced materials become increasingly




State-of-the-art Micromanipulation systems for your research needs.

Fast, non-destructive thermal analysis of a wide range of materials

State-of-the-art polariscope technology for precise
stress and strain analysis.






State-of-the-art Micromanipulation systems for your research needs.

Fast, non-destructive thermal analysis of a wide range of materials

State-of-the-art polariscope technology for precise
stress and strain analysis.


We have a broad range of applications including the fields below. If you do not see your application or have additional questions, please contact us.








December 15, 2022Barnett Technical Services will be working with LUCEO in booth…
March 21, 2022We are very excited to be attending Materials Research Society…
January 1, 2026In modern manufacturing environments, precision, efficiency, and consistency are non-negotiable.…
November 1, 2023Visit us at the 2023 Glass Problems ConferenceNov 6-8, Columbus,…
June 20, 2025In the ever-evolving field of optical microscopy, Coherent Anti-Stokes Raman…
September 30, 2024Stress and strain analysis hold a huge importance in quality…
November 6, 2025Barnett Technical Services (BTS) is pleased to announce participation in…
April 28, 2019We will be demonstrating the Microsupport Axis Pro micromanipulator at…
January 1, 2026Image Credit: www.researchgate.net In nanotechnology, pharmaceuticals, materials science, and countless…

As semiconductor devices, electronic components, and advanced materials become increasingly

Resistance measurement and continuity testing are widely used to evaluate

Advanced materials research continues to move toward smaller feature sizes,

As materials research, semiconductor analysis, and micro-scale characterization continue to

Handling microscopic particles presents significant challenges in analytical, research, and

Accurate measurement of greenhouse gas exchange between soils and the