BTS offers a range of products for use in the semiconductor and materials science fields.

FIB Foil Lift-Out With the Micro Support Benchtop Micromanipulator

  • TEM imaging is an extremely valuable tool for a wide range of materials. Samples are normally formed by FIB preparation in an SEM followed by lift-out. Traditionally, this lift-out process is performed inside the SEM chamber (in situ). However, this process takes up valuable chamber time since the lift-out process can be performed outside the chamber (ex situ).
  • A Steve’s Solutions using the Micro Support Axis Pro Benchtop Micromanipulator for ex situ lift-out may be found here.

Molecular and Elemental Microanalysis

Stress in Transparent Optics