The visualization and measurement of internal stress in transparent materials is grounded in one of the most fundamental optical methods: the Crossed Nicols Method. Luceo has built upon this classical optical technique to develop advanced strain measurement instruments that integrate traditional optics with modern technology and precision. This blog explains how this fundamental approach enabled Luceo to create sophisticated strain measurement solutions.

Luceo Strain Meter Expertise

For over two decades, Luceo has developed and manufactured high-quality polariscopes and polarimeters featuring in-house manufactured polarizers and waveplates. The company’s deep expertise in optical polarization and engineering ensures that every strain measurement application meets stringent accuracy and performance requirements.

Luceo’s approach is grounded in first principles of optical science, complemented by cutting-edge production engineering. By manufacturing their own optical components, Luceo ensures exceptional performance, consistent quality, and high reliability across their entire range of strain measurement instruments.

The Crossed Nicols Method Explained

The Crossed Nicols Method is the classical technique for observing birefringence in transparent materials. The term “crossed Nicols” refers to positioning a test specimen between two polarizing elements – a polarizer and an analyser – arranged at 90° to each other. Without a birefringent specimen, no light passes through, resulting in a dark field.

When a stressed transparent component is introduced, internal stresses cause birefringence, generating optical phase differences in the transmitted light. These phase shifts allow light to pass through the analyzer, visually revealing bright areas against a dark background. This fundamental principle underlies all modern photoelastic stress analysis techniques.

Luceo has enhanced the traditional concept by increasing precision and adding automation while preserving its core optical principles.

Historical Background and Modern Usage

The traditional crossed Nicols setup typically consists of a microscope with a rotating stage, a polarizer beneath the stage, and an analyzer above the objective or eyepiece. Luceo has advanced this design in their modern systems, offering greater sensitivity, wider applicability, and full automation.

Advantages of the Crossed Nicols Method:

  • Wide Applicability: Works for all transparent materials that exhibit stress-induced birefringence (glass, plastics, crystals, composites).
  • High Sensitivity: Detects even very small stress concentrations critical for predicting material failure.
  • Non-Destructive Testing: Enables 100% component inspection in production without damaging the material.

Practical Example: Resin Flow State Analysis

In manufacturing, resin materials develop complex stress patterns due to factors such as:
• Non-uniform cooling rates
• Flow channel restrictions during injection molding
• Differing thermal expansion coefficients
• Process parameter variations

Under the crossed Nicols method, bright fringe patterns indicate areas of high stress concentration, while dark regions represent stress-free zones. This provides immediate, interpretable feedback on the component’s quality.

Technical Implementation in Luceo Systems

• High-Quality Optical Components: In-house-manufactured polarizers ensure uniform extinction ratios and minimal measurement errors.
• Reliable Mechanical Systems: Precise rotation mechanisms enable repeatable, quantitative measurements.
• Uniform Illumination: Stable light sources guarantee consistent measurement conditions free from glare and spectral variability.

Applications Across Industries

Luceo systems are widely applied in various manufacturing sectors:

  • Glass Industry: Detection of residual stress in optics, safety glass, and architectural glazing.
  • Plastics Industry: Quality control of injection-molded parts, extruded profiles, and optical films.
  • Electronics: Stress-free assembly verification in semiconductor packages and optical devices.
  • Automotive: Stress analysis of windshields, headlights, and transparent trim components to identify weak points.

Partnering with Luceo Technology

The Crossed Nicols Method in Luceo strain meters exemplifies the perfect synergy of classical optical science and modern engineering precision. Luceo has advanced a traditional technique by integrating automation and digital systems, creating measuring solutions that combine the dependability of trusted principles with the accuracy required for modern manufacturing.

From understanding complex resin flow stress distributions to identifying critical stress concentrations in safety glass components, the Crossed Nicols Method remains a fundamental, non-destructive technique in optical stress analysis.

Barnett Technical Services is proud to be an authorized distributor of Luceo products. Explore the full range of Luceo strain meters and polariscope solutions designed for stress analysis here:
Barnett Technical Services – Polariscopes

Example of Appearance under Inspection Unevenness of a Film

Example of Appearance under Inspection Strain resulted from Processing

Example of Appearance under Inspection Strain and cracks in a molded article.

Sample with substantially no strain The whole of a sample appears dark in blackish color similarly to the visual field.

Sample with less degree of strain Outer peripheral region of a sample appears in whitish color.

Sample with greater degree of strain Region in whitish color in the outer periphery of a sample, where strain exists, extends inwardly. Also, the whitish region appears brighter than a sample with less degree of strain

Sample at the Reference Position/ Rotated Angle 0° X-shaped region in the transmission axis direction of a polarizer or an analyzer appears in blackish color.

Sample rotated by 45° X-shaped region appeared in sensible color remains in the same direction irrespective of the direction change of a sample. Due to this, the pattern of strain varies.

Sample rotated by 90° Pattern of strain in a sample is same as that of a sample at the reference position.