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Optical Metrology Instruments

Barnett Technical Services offers a range of optical metrology instruments from leading scientific instrument manufacturers, providing advanced solutions for precise measurement and characterization of optical components, materials, and surfaces. Designed for both research and industrial environments, these optical metrology systems deliver high-resolution measurement capabilities for evaluating optical performance, wavefront quality, phase information, and material properties.

Barnett Technical Services works closely with customers to identify the right optical metrology solution for their specific requirements. Our team provides technical guidance, application support, and assistance with integrating optical metrology instruments into existing workflows, helping organizations achieve reliable and accurate measurement results while maximizing the value of their scientific instrumentation investments.

Wavefront Sensors

SEBI® RT1000

Wavefront Phase Imaging Sensor The SEBI® RT1000 is a high-resolution wavefront sensor des..

Advanced Optical Metrology Systems for Precision Measurement

Our advanced optical metrology systems offer versatile measurement capabilities for demanding research and industrial applications, including:

High-resolution measurement: Our optical metrology systems provide detailed and repeatable measurements for evaluating optical components, surfaces, and materials where accuracy and measurement resolution are critical.
Non-contact measurement: Optical techniques enable measurement without direct physical contact with the sample, making our solutions suitable for applications where sample integrity and non-destructive analysis are important.
Wavefront and phase measurement: Specialized optical metrology instruments can capture wavefront and phase information, supporting detailed analysis of optical behavior, aberrations, and surface characteristics.
Surface and material characterization: Optical measuring instruments in metrology in our inventory provide quantitative information about surface profiles, material properties, and optical characteristics across a range of samples.
Precision optical measurement: Our high-resolution optical measurement solutions support research, development, testing, and industrial applications requiring accurate and repeatable characterization.

Optical Metrology Applications

Optical metrology instruments support a wide range of applications where accurate measurement and characterization are essential, including:

Semiconductor Inspection and Metrology: Optical metrology supports semiconductor manufacturing by enabling measurement of wafer stress, warpage, topography, and surface characteristics for process monitoring and manufacturing control.
Materials Characterization: Our optical measurement solutions can be used to characterize transparent and reflective materials, including surface characteristics and optical properties, supporting materials research and inspection.
Research and Development: Our optical metrology systems support R&D activities where quantitative optical measurement is required for investigating components, materials, surfaces, and emerging optical technologies.

Find the Right Optical Metrology Solution

Feel free to contact Barnett Technical Services via phone or email for further information on optical metrology instruments and how our precision optical measurement solutions can support your research, testing, or industrial application.