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Micromanipulator Probes

MicroSupport micromanipulator probes are precision tools designed for manipulation, sampling, testing, and transfer of microscopic objects and materials. Applications such as isolating foreign particles, lifting out FIB-prepared thin films, probing micron-level wiring patterns, extracting embedded contaminants, and handling delicate microscale samples require specialized probe geometries and materials for accurate operation. MicroSupport is a leading manufacturer of micromanipulators and precision probe tools, offering one of the industry's widest selections of micromanipulator accessories for analytical sample preparation and microscale handling applications. Barnett Technical Services is an authorized distributor of MicroSupport products, supplying advanced micromanipulator probe solutions to semiconductor laboratories, failure analysis facilities, research institutions, and materials science environments.

Products

Flex Probe

Flexible resin micro-sampling tool designed for collection and transfer of microscopic for..

MICRO-PRESS TOOL

Glass-made micro-press tool engineered for controlled sample compression and material redu..

MICRO-PIPETTE

Glass-made micro-pipette engineered as a capillary-shaped tool for precision liquid transf..

Micro-sampling probe

Glass-made sampling probe with precision needle-shaped tip geometry engineered for ultra-d..

Tungsten Carbide Probe

Multi-purpose hard metal probes suitable for poking, breaking in between substances, cutti..

Tungsten Probe

For a wide range of purposes, such as poking, rubbing, scraping, picking up, and probing s..

MicroSupport Micromanipulator Probe Offerings

MicroSupport micromanipulator probes are designed for precision sampling, microscopic manipulation, cutting, transfer, and analytical preparation applications. Available in multiple materials and configurations, these probes support semiconductor failure analysis, FIB sample preparation, contamination analysis, electronics inspection, and advanced microscopy workflows.

Tungsten Probe

The tungsten probe is a versatile general purpose probe available in tip diameters ranging from 0.2μm to 30μm. Ultra-fine tips support handling of microscopic particles and thin films, while larger tip sizes provide improved flexibility and durability for routine manual operations. Optional probe benders and dedicated handles support both manipulator mounting and handheld use.

Tungsten Carbide Probe

Tungsten carbide probes are engineered for applications requiring high rigidity, cutting strength, and durability. Available in probe, knife, scraper, and fork geometries, these tools support precision cutting, surface marking, contaminant extraction, polymer film cutting, bonding wire cutting, and hard material processing applications.

Micropipettes

MicroSupport micropipettes are precision glass tools developed for microscopic sample suction, liquid handling, and controlled sample transfer. Available in multiple inner diameters, these pipettes can be used with vacuum absorption tools or micro-injector systems for accurate pickup and dispensing of liquids and microscopic particles.

Micro-Sampling Probes

Micro-sampling probes are designed for lift-out and transfer of thin film specimens prepared using FIB systems. Fine tip configurations provide stable handling of delicate microscopic samples during semiconductor failure analysis and analytical sample preparation workflows.

Micro-Press Tools

Micro-press tools help compress collected microscopic samples into thinner layers suitable for microscopy and analytical evaluation. These tools allow visual confirmation during sample preparation while supporting controlled thinning of delicate foreign materials and microscopic specimens.

Flex Probe

The flex probe is designed for confined spaces and difficult-to-access inspection areas where rigid probes cannot operate effectively. Its flexible structure enables collection of particles and thin film samples from narrow cavities, corner regions, LCD cells, and other compact assemblies.

Advantages of MicroSupport Micromanipulator Probes

Broad Range of Probe Materials and Configurations: With probe options available in tungsten, tungsten carbide, flexible materials, and precision glass, MicroSupport offers specialized solutions for diverse microscale sampling, cutting, transfer, and probing applications. Multiple tip diameters and geometries allow users to select probes optimized for specific analytical tasks.
Sub-Micron Precision Capabilities: Tungsten probe tips as fine as 0.2μm support isolation and manipulation of microscopic particles and thin film structures that cannot be handled using conventional tools. This precision is essential for semiconductor failure analysis, nanotechnology research, and advanced materials science applications.
Compatibility with MicroSupport Micromanipulator Systems: All probe types are engineered for integration with MicroSupport Axis Pro and Quick Pro micromanipulator systems, providing stable positioning, repeatable movement control, and simplified probe interchangeability during analytical workflows.
Reduced Risk of Sample Damage: Each probe design is optimized for specific handling requirements while minimizing disturbance to surrounding materials. Tungsten carbide tools enable controlled cutting and contaminant extraction, while flexible and glass probes support delicate handling of fragile microscopic specimens and thin films.

Applications of MicroSupport Micromanipulator Probes

Semiconductor and Electronics Failure Analysis: Tungsten and tungsten carbide probes are widely used for isolating foreign particles, probing micron-scale wiring patterns, extracting embedded contaminants, and performing defect analysis on wafers, IC packages, and electronic assemblies.
FIB Sample Preparation and Lift-Out: Micro-sampling probes support controlled lift-out and transfer of FIB-prepared thin film specimens during advanced microscopy and semiconductor failure analysis workflows. The optional high-precision rotator accessory improves positioning accuracy and transfer efficiency during sample handling procedures.
Precision Liquid Handling and Sample Transfer: Micropipettes are used for vacuum absorption of microscopic particles, liquid handling, and controlled transfer of delicate microscale samples in analytical laboratories and semiconductor research environments.
Pharmaceutical and Contamination Analysis: Knife-edged tungsten carbide probes allow extraction of embedded contaminants from pharmaceutical tablets, polymers, and hard materials without damaging surrounding structures, supporting targeted contamination analysis procedures.
LCD and Precision Component Inspection: Flex probes enable sample collection and particle removal from narrow cavities, corners, and confined regions within LCD panels, display assemblies, and other miniature electronic components where rigid probes cannot access.