- 1,000 × 1,000 wavefront phase and intensity sampling at full detector resolution
- Real-time processing at 30 FPS
- Absolute wavefront accuracy < λ/30 RMS
- Wavefront repeatability ~ λ/30 RMS
- 7 µm lateral resolution
- Maximum pupil aperture: 15 × 15 mm²
- Compatible with transparent and reflective samples
- No moving parts — electrically tunable lens (poLight TLens®, piezo MEMS)
- Inherently vibration-immune
- Wavelength range: 450–650 nm (monochromatic incoherent, e.g. LED — no laser required)
- USB 3.0 interface — Windows OS
- Compact form factor, integrates into existing optical setups
- Plug-and-play — ready to use out of the box
- Speeds up quality control, accelerates R&D, reduces metrology costs
- Includes SEBI® Analyzer Suite software
Optical Characterization
Characterize lenses, windows, waveplates, mirrors, and other optical components with 7 µm lateral resolution. The RT1000 detects fine polishing errors, surface irregularities, astigmatism across multiple diopter values and angles, and high-frequency wavefront content that falls below the resolution limit of conventional Shack-Hartmann sensors.
Material Inspection
Non-destructive inspection of transparent and reflective materials — optical glass, polymers, semiconductor substrates, and thin films — for refractive index inhomogeneities, thickness gradients, internal stress variations, and surface form. The high dynamic range enables measurements spanning the nanometer to micrometer scale in a single acquisition.
Real-Time Observation of Dynamic Samples
Observe live biological or dynamic samples — cells, neurons, tissue sections — in quantitative phase imaging mode without fluorescent labels, dyes, or staining. The 30 FPS real-time capability enables live-cell dynamics, motility studies, and immediate observation of sample responses, making it well suited for oncological research and quantitative phase microscopy.
| Parameter | Specification |
|---|---|
| Phase & Intensity Sampling | 1,000 × 1,000 pixels |
| Wavefront Accuracy (Absolute) | < λ/30 RMS |
| Wavefront Repeatability | ~ λ/30 RMS |
| Acquisition Rate | 30 FPS |
| Wavelength Range | 450 – 650 nm |
| Pupil Dimension (max) | 15 × 15 mm² |
| Light Source | Monochromatic incoherent LED — no laser required |
| Detector Type | CMOS |
| Tunable Lens | poLight TLens® (piezo MEMS) |
| Moving Parts | None |
| Interface | USB 3.0 |
| Operating System | Windows |
| Sample Compatibility | Transparent and reflective |
| Software | SEBI® Analyzer Suite (included) |
| Manufacturer | Wooptix S.L. — Tenerife / Madrid, Spain; San Francisco, USA |