SEBI® RT1000

SEBI® RT1000

Wavefront Phase Imaging Sensor

The SEBI® RT1000 is a high-resolution wavefront sensor designed for real-time wavefront measurement and advanced optical characterization. Using Wavefront Phase Imaging (WFPI) technology, it enables accurate quantitative phase imaging of optical systems and material samples. Two out-of-focus intensity images are acquired in real time using an electrically tunable lens (ETL) and processed to reconstruct the full wavefront phase.

This sensor can be configured to measure both transparent and reflective samples with nanometer- and micrometer-scale sensitivity. With 1000 × 1000 pixel phase sampling, real-time processing at 30 FPS, and wavefront accuracy better than λ/30 RMS, it is well suited for demanding metrology, inspection, and research applications.

  • 1,000 × 1,000 wavefront phase and intensity sampling at full detector resolution
  • Real-time processing at 30 FPS
  • Absolute wavefront accuracy < λ/30 RMS
  • Wavefront repeatability ~ λ/30 RMS
  • 7 µm lateral resolution
  • Maximum pupil aperture: 15 × 15 mm²
  • Compatible with transparent and reflective samples
  • No moving parts — electrically tunable lens (poLight TLens®, piezo MEMS)
  • Inherently vibration-immune
  • Wavelength range: 450–650 nm (monochromatic incoherent, e.g. LED — no laser required)
  • USB 3.0 interface — Windows OS
  • Compact form factor, integrates into existing optical setups
  • Plug-and-play — ready to use out of the box
  • Speeds up quality control, accelerates R&D, reduces metrology costs
  • Includes SEBI® Analyzer Suite software
Optical characterization illustration

Optical Characterization

Characterize lenses, windows, waveplates, mirrors, and other optical components with 7 µm lateral resolution. The RT1000 detects fine polishing errors, surface irregularities, astigmatism across multiple diopter values and angles, and high-frequency wavefront content that falls below the resolution limit of conventional Shack-Hartmann sensors.
Material inspection illustration

Material Inspection

Non-destructive inspection of transparent and reflective materials — optical glass, polymers, semiconductor substrates, and thin films — for refractive index inhomogeneities, thickness gradients, internal stress variations, and surface form. The high dynamic range enables measurements spanning the nanometer to micrometer scale in a single acquisition.
Quantitative phase imaging illustration

Quantitative Phase Imaging

Perform label-free quantitative imaging of transparent and semi-transparent samples by measuring optical path length variations with nanometric sensitivity. The RT1000 enables precise reconstruction of phase maps to extract thickness, morphology, and refractive index information. This makes it ideal for biological research, cell analysis, and advanced microscopy applications where non-invasive, high-resolution measurement is required.
Real-time observation of dynamic samples

Real-Time Observation of Dynamic Samples

Observe live biological or dynamic samples — cells, neurons, tissue sections — in quantitative phase imaging mode without fluorescent labels, dyes, or staining. The 30 FPS real-time capability enables live-cell dynamics, motility studies, and immediate observation of sample responses, making it well suited for oncological research and quantitative phase microscopy.
ParameterSpecification
Phase & Intensity Sampling1,000 × 1,000 pixels
Wavefront Accuracy (Absolute)< λ/30 RMS
Wavefront Repeatability~ λ/30 RMS
Acquisition Rate30 FPS
Wavelength Range450 – 650 nm
Pupil Dimension (max)15 × 15 mm²
Light SourceMonochromatic incoherent LED — no laser required
Detector TypeCMOS
Tunable LenspoLight TLens® (piezo MEMS)
Moving PartsNone
InterfaceUSB 3.0
Operating SystemWindows
Sample CompatibilityTransparent and reflective
SoftwareSEBI® Analyzer Suite (included)
ManufacturerWooptix S.L. — Tenerife / Madrid, Spain; San Francisco, USA