Sample Holder for Slabs, Wafers, Sheets, Textiles and Films

Up to 1000°C

This sample holder is to be used when testing highly thermal conductive slab or sheet samples (with our Slab Measurement Module) that are relatively stiff, such as metal slabs, graphite sheets or laminates, and semiconductor wafers. At ambient temperatures below 400°C, this sample holder is typically applied with our Kapton-insulated Hot Disk^® sensor models 5501 and 8563. At higher temperatures, it is typically used with our Mica-insulated Hot Disk^® sensor model 5082.