Electrical Probe Stations

Electrical probe stations serve as a platform for probe head positioning in micromanipulators, which are used for testing of electronic devices. Barnett Technical Services is an authorized distributor of micromanipulators and related tools by Micro Support, which can be combined to form an electrical probe station.

AxisPro for Probing: This micromanipulator probe station can be easily configured with one μm probe-positioning accuracy. In the standard configuration, it is offered with two arms; however, the probe stations can be customized with three or more arms.

QuickPro for Probing Applications: This electrical probe station offers standalone probing for high-precision probe positioning. MicroSupport’s Quick Pro arms can be configured with a white light microscope to provide electrical probing with up to four probes, which can each be positioned with one μm accuracy. Typical images of single probe arms and four-probe configurations are shown below.

Micro Support Single Electrical Probe
Micro Support Quick Pro With Typical Probe Holder
Micro Support Probe Station
Micro Support Four-Probe Station
Micro Support Probe Close Up
Close-up View of Micro Support Four-Probe System

Products

Axis Pro Benchtop micromanipulator

Axis Pro

Benchtop micromanipulator incorporating a zoom microscope and motorized sampling arms...

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QuickPro-1024x526

Quick Pro

Individual micromanipulator arm that can be added to a white light microscope...

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Applications of Electrical Probe Stations

Electrical probe stations are widely utilized in a variety of fields, showcasing their adaptability and importance. Key applications include:
  • Semiconductor Device Testing: Essential for evaluating the performance, reliability, and functionality of semiconductor devices,
  • Failure Analysis in Microelectronics: Crucial for identifying and resolving defects in electronic circuits to improving product quality.
  • Material Research in Nanotechnology: Used to investigate the electrical properties of nanomaterials, enabling breakthroughs in material science.
  • Electrical Characterization of MEMS Devices: Supports testing of Micro-Electro-Mechanical Systems (MEMS), which are used in sensors and actuators.
  • R&D Labs and Manufacturing: Integral in research environments and production lines, enabling the development and refinement of cutting-edge technologies.

Advantages of Using Micromanipulator Probe Stations

Micromanipulator probe stations elevate testing precision and adaptability, offering several benefits:
  • Unmatched Accuracy and Repeatability: Achieve sub-micron positioning, enabling highly sensitive and reliable testing.
  • Modular Design for Customization: Adapt probe stations to meet specific testing needs,
  • Integration with Advanced Imaging Tools: Seamlessly pair with Scanning Electron Microscopes (SEM) or white light microscopes, providing enhanced visualization and analysis during testing.

Tips for Choosing the Right Probe Station

Selecting the right probe station is critical to ensuring optimal performance and meeting testing requirements. Consider the following criteria:
  • Positioning Accuracy: Evaluate the level of precision required for your testing applications to ensure the probe station meets your specifications.
  • Number of Probes Needed: Determine the number of probes required, whether for single-probe configurations or more complex multi-probe setups.
  • Compatibility with Existing Equipment: Ensure the probe station is compatible with your laboratory’s current tools.
  • Frequency of Use and Durability: Assess the station’s robustness to withstand frequent usage while maintaining consistent performance.
Micro Support offers electrical probe stations that can be configured for up to four probes around a white light microscope. These products offer superior positioning capabilities with a simple interface for positioning control. Barnett Technical Services is the distributor of these products from Micro Support.