Barnett Technical Services at ISTFA 2024: Experience Electrical Testing with MicroSupport Probe Stations
Barnett Technical Services (BTS) is excited to announce our participation in ISTFA 2024, the premier global event for the microelectronics failure analysis community. The symposium will take place from October 28th to November 1st at the San Diego Convention Center in San Diego, California. Visit us at Booth 206 to explore the latest micromanipulation technologies and precision material handling tools, including electrical testing capabilities.
Electrical Testing with MicroSupport Probe Stations
BTS is proud to showcase our electrical testing solutions powered by MicroSupport’s cutting-edge probe stations. These versatile platforms are designed to precisely position micromanipulator probes for accurate electronic device testing. With their high-precision electrical probing capabilities, MicroSupport probe stations are ideal for semiconductor and microelectronics applications.
AxisPro: Unmatched Precision for Electrical Probing
The AxisPro electrical probe station delivers unparalleled precision with a remarkable 1µm probe-positioning accuracy. Its standard configuration features two arms, but can be easily customized with three or more arms to meet your specific testing needs. This adaptability ensures accurate and efficient electrical testing across a wide range of applications.
QuickPro: A Compact Solution for Electrical Testing
Designed for standalone high-precision electrical probing, the QuickPro electrical probe station offers exceptional flexibility. Configure it with up to four probes, each capable of being positioned with 1µm accuracy. When paired with a white light microscope, QuickPro provides precise and adaptable probing, making it an ideal choice for failure analysis and semiconductor testing.
D-MARK: Sample Marking For Failure Analysis Applications
The D-MARK systems is a simple tool that permits defects and failures to be marked for transfer to failure analysis groups. This system facilitates defect localization and speeds up the failure analysis process.
About ISTFA 2024
The International Symposium for Testing and Failure Analysis (ISTFA) is the premier annual gathering for professionals dedicated to semiconductor failure analysis. Celebrating its 50th edition in 2024, ISTFA continues to be the cornerstone event for sharing knowledge and advancing techniques in the field. Organized by ASM International, the symposium provides:
- In-depth technical programs on the latest advancements
- Networking opportunities with global experts
- Exhibitions featuring cutting-edge technologies for microelectronics testing and failure analysis
For more details, visit the official ISTFA 2024 website
Visit Us at Booth 206!
Join Barnett Technical Services at Booth 206 to explore our advanced micromanipulation probe statiations with electrical testing capabilities. Our experts will demonstrate these technologies and discuss how they can enhance your failure analysis and material handling workflows.
Don’t miss this opportunity to elevate your expertise and discover tools that can make a significant impact in your work.