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Home » Attolight Applications » Page 2

Attolight Applications

  • Non-destructive control of epitaxial layer uniformity in GaN power devices
  • Correlating structural and optical properties of lead halide perovskites
  • Comprehensive defect review and classification for SiC
  • Non-destructive quality control of micron-sized light emitting diodes
  • Resolving individual quantum emitters in GaN-AlN superlattice nanowires
  • Dislocation type determination by cathodoluminescence
  • Applications on Quantum Heterostructures
  • Pinhole Detection in Photovoltaic and Thin Film Battery Materials
  • Applications on ZnO micro/nanowire Materials
  • Applications on GaN for Power Electronic
  • Applications on Hyperspectral Mapping with high Spatial Resolution for Optoelectronic Devices
  • Applications on Photovoltaic Materials
  • Applications on Semiconducting Diamond
  • Applications on Defect Visualization and Counting in Optoelectronic Materials
  • CL from beam-sensitive optoelectronic materials – hybrid halide perovskites

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    Applications on GaN for Power Electronic

    Applications on GaN for Power Electronic

    Applications on Hyperspectral Mapping with high Spatial Resolution for Optoelectronic Devices

    Applications on Hyperspectral Mapping with high Spatial Resolution for Optoelectronic Devices

    Applications on Photovoltaic Materials

    Applications on Photovoltaic Materials

    Applications on Semiconducting Diamond

    Applications on Semiconducting Diamond

    Defect Visualization and Counting in Optoelectronic Materials

    Applications on Defect Visualization and Counting in Optoelectronic Materials

    CL from beam-sensitive optoelectronic materials – hybrid halide perovskites

    CL from beam-sensitive optoelectronic materials – hybrid halide perovskites

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    Barnett Technical Services started in 2010 to provide consulting and training services for the analytical instrumentation industry, especially those techniques that involve the use of light for chemical and material analysis….Read more

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