The LSM-9001NIR fully automatic polarimeter for low phase difference products such as semiconductor wafers. This remarkable new technology allows for stress inspection of previously impossible materials.
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STRESS – WRITE ABOUT THAT HERE
With the NIR instrument you can now look for stress in the following materials
- Silicon Wafers
- Silicon [Si]
- Silicon Carbide[SiC]
- Gallium Nitride [GaN]
- Glass wafer
- Transparent and colored resin products
- Crystallized Quartz / Quartz / Optical crystals
The Luceo LSM-9101NIR is an automated polariscope that provides precise retardation measurements with image resolutions as small as 10 microns per pixel. Polarized source light is passed through a transmitting optical material and then passed through an analyzing polarizer and onto a detector. Rotation of the analyzing polarizer through a range of angles allows for calculation of the retardation at different areas of the optical component being measured.
Specifications
| Inspection Method | NIR Rotating Analyzer Method |
| Measurement Range (approx.) | 0～150nm (Retardation) |
| Measurement area size | (approx.) 50×50mm |
| Measurement object placement space (height) | Max 160mm |
| Size | W300 ☓ D353 ☓ H540 mm |
| Weight | 22 kg |
| Others | Light Source：high-luminanceLED PowerSorce：AC100～240V 50/60Hz DC input 24V 1.6A Component：Mainbody,PC,Cables Accessory：Main body cover OS:Windows10 Pro (64bit) |
Conclusions
Stress
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Luceo Strain Analyzers
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