Near Infrared Polariscope
The LSM-9001NIR fully automatic polarimeter for low phase difference products such as semiconductor wafers. This remarkable new technology allows for stress inspection of previously impossible materials.
[WD_Button id=2788] [WD_Button id=2792]
STRESS – WRITE ABOUT THAT HERE
With the NIR instrument you can now look for stress in the following materials
- Silicon Wafers
- Silicon [Si]
- Silicon Carbide[SiC]
- Gallium Nitride [GaN]
- Glass wafer
- Transparent and colored resin products
- Crystallized Quartz / Quartz / Optical crystals
The Luceo LSM-9101NIR is an automated polariscope that provides precise retardation measurements with image resolutions as small as 10 microns per pixel. Polarized source light is passed through a transmitting optical material and then passed through an analyzing polarizer and onto a detector. Rotation of the analyzing polarizer through a range of angles allows for calculation of the retardation at different areas of the optical component being measured.
Specifications
| Inspection Method | NIR Rotating Analyzer Method |
| Measurement Range (approx.) | 0～150nm (Retardation) |
| Measurement area size | (approx.) 50×50mm |
| Measurement object placement space (height) | Max 160mm |
| Size | W300 ☓ D353 ☓ H540 mm |
| Weight | 22 kg |
| Others | Light Source：high-luminanceLED PowerSorce：AC100～240V 50/60Hz DC input 24V 1.6A Component：Mainbody,PC,Cables Accessory：Main body cover OS:Windows10 Pro (64bit) |
Conclusions
Stress
For More information
Steve’s Solutions
To view Polarizers in action, visit the Steve’s Solutions articles featuring these instruments.
For More information
Luceo Strain Analyzers
Luceo Manufacturer Website
Contact Us Online Form
Phone: 916-897-2441
Email: [email protected]
