LSM-9001NIR

Evaluate strain with 2D distribution of low phase difference samples such as semiconductor wafers, colored glass, and colored acrylic resin products. Evaluate up to approx. 50 x 50 mm in 1 minute. Fully automatic measurement reduces work and measurement errors by the measurer. This is capable of performing strain evaluating of semiconductor wafers, colored or transparent products, residual stress, and cracks that are impossible to measure with conventional polariscope.