Micro-sampling probe
- Glass-made sampling probe with precision needle-shaped tip geometry engineered for ultra-delicate sample manipulation and FIB thin foil lift-out operations
- Fine needle-shaped tip design enables penetration and contact with microscopic features while minimizing surface damage and disturbance to surrounding materials
- Specifically optimized for FIB-processed thin foil sample extraction, with geometry designed to provide secure hold without introducing defects or causing fracture
- Ideal for use in very delicate sampling applications where sample integrity is critical and any mechanical trauma would compromise analysis or research results
- Tip sizes from 2μm to 7μm provide versatility across different FIB sample dimensions and applications while maintaining precision contact geometry
- Compatible with both automated micromanipulator systems and handheld manual manipulation for maximum operational flexibility in FIB and electron microscopy applications
- FIB Thin Foil Lift-Out and Transfer - Extract thin foil sections from FIB-milled specimens for transmission electron microscopy analysis. Needle geometry enables penetration of supporting tether connections while providing secure support for the foil. Minimal contact area minimizes mechanical disturbance, ensuring foil arrives at analysis instrument undamaged and preserving structural integrity for accurate analysis.
- Delicate Crystalline Specimen Handling - Manipulate brittle crystalline materials that are prone to cleavage fracture along preferred crystallographic planes. Minimal contact area and fine needle geometry prevent stress concentration that would initiate catastrophic failure. Enables safe handling and repositioning of precious crystalline samples without risk of material loss or fracture.
- Composite Structure Delamination Prevention - Handle layered composite materials and multi-phase structures without causing layer separation. Delicate contact geometry enables sample repositioning and transfer without applying shear forces to layer interfaces. Critical for maintaining composite structure integrity during failure analysis and materials characterization of sensitive multi-material systems.
- Optical Observation During Delicate Manipulation - Direct optical microscopy observation of probe-sample contact point during FIB lift-out and sample extraction. Transparent borosilicate glass construction enables real-time monitoring of tether penetration, sample response, and contact confirmation. Direct optical feedback allows operators to adjust technique dynamically for optimal extraction results and sample preservation.
- Microscopic Foil Positioning and Orientation - Perform minute adjustments to extracted FIB foil position and tilt on analytical instrument holders without applying excessive mechanical force. Fine needle enables precise positioning for optimized analytical geometry. Essential for maximizing information content from TEM analysis and ensuring proper foil orientation for cross-sectional analysis of specific features.
- Precious Specimen Safe Transfer - Transfer irreplaceable research specimens including rare geological materials, unique crystalline samples, and one-of-a-kind biological preparations from preparation stage to analysis instruments. Design minimizes mechanical trauma, ensuring precious samples arrive in pristine condition. Technique enables safe handling of valuable materials where manipulation errors cannot be tolerated or repeated.
SAMPLING PROBE - PRODUCT SPECIFICATIONS
| Model Number | Needle Tip Size | Tip Apex Radius | Quantity | Recommended Foil Thickness | Primary Application |
|---|---|---|---|---|---|
| MST-002 | 2μm | <50nm | 1 | 0.1-0.2μm | Ultra-thin FIB foils, delicate samples |
| MST-005 | 5μm | <100nm | 10 | 0.2-0.5μm | Standard FIB thin foil lift-out |
| MST-007 | 7μm | <150nm | 1 | 0.5-1.0μm | Larger foils, rapid manipulation |
Technical Specifications:
- Material: High-purity borosilicate glass
- Tip Shape: Needle (tapered conical geometry)
- Dimensional Tolerance: ±0.2μm on tip apex
- Surface Finish: <5 nm Ra (ultra-smooth)
- Optical Clarity: >99% visible-infrared spectrum
- Refractive Index: 1.52 ± 0.02
- Operating Temperature: -10°C to +60°C
- Compatibility: Micromanipulator systems, FIB-integrated equipment