![P-Tungstencarbidetool (1)](https://barnett-technical.com/wp-content/uploads/2024/02/P-Tungstencarbidetool-1.jpg)
Tungsten Carbide Probe
- Multi-purpose hard metal probes suitable for poking, breaking in between substances, cutting, scraping, marking, and more. It is available in various shapes e.g., probe, knife, scraper, and fork.
- 5μm probes allow for precise cutting of hard materials like metal, silicon wafers, and glass, as well as marking targets before FIB processing.
- Micro-peelers, with their sculpting knife-like tips, offer a wide range of material compatibility, suitable for flat-surface cutting of polymer like high-barrier films, as well as removing small embedded particles, eliminating micro-protrusions, pinpoint cutting of IC bonding wires, and cutting tiny wires.
- Knife-edged probes are effective for collecting foreign substances embedded in tablets and extracting foreign objects buried in non-ferrous metals, hard plastics, etc. It can also be used for ultra-fine marking.
![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/4-Available-to-pick-up-foreign-substance-only-without-damaging-base-material.-300x300.jpg)
Foreign objects can be sampled by scraping or shaving only the adhered foreign substances without destroying the base material
![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/7-Axis-Pro-is-applicable-for-deburr-without-making-any-damages-on-the-base-material.-300x300.jpg)
Axis Pro is applicable for deburr without making any damages on the base material.
![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/27-Possible-to-mark-5μm-width-lines-on-hard-materials-300x300-1-300x300.jpg)
Precise surface marking on hard materials, including glass, silicon wafers, and metals facilitated by hard metal tools
![](https://www.microsupport.co.jp/en/wp-content/uploads/2022/11/30-Hard-metal-tools-are-available-to-make-microscopic-markings-on-hard-materials-such-as-metal-1-300x300.jpg)