SciX 2017

We are very excited to be attending SciX 2017 in Reno, NV.

We will be at booth #66 representing a number of products:

Axis Pro Micromanipulator

Micro Support Micromanipulators

Manipulation of small materials.Probes available for a wide range of sample manipulations, including:

  • Isolating particles
  • Cutting
  • Milling off a surface
  • Nanoliquid deposition
  • Vacuum for material removal

Arms also be added to FTIR or Raman Microscopes

Talys Near-IR  Process Monitoring System
Talys Near-IR  Process Monitoring System

ABB FT-IR/Near-IR Systems

FT-IR/Near-IR/ICOS Systems

Mid-IR and Near-IR systems designed for benchtop and process monitoring applications.

Los Gatos Research ICOS gas sensors for rapid ppb-level detection.


Tornado Raman Systems – Booth 99

Tornado’s HyperFlux PRO Plus

Tornado’s HyperFlux PRO Plus is the first Raman spectroscopy system with enough speed and sensitivity to be broadly deployed for real-time process monitoring, control, and optimization.

HyperFlex PRO Plus includes a proprietary HTVS-enabled spectrometer with an order of magnitude improvement in optical throughput, a high-quality stabilized laser, and numerous features to ensure safety and stability.
This powerful, reliable, and easy-to-use instrument is a perfect solution for both process and laboratory settings
Helma Reva
Need a simple, robust system to teach Raman spectroscopy? The Hellma Reva Educational Raman Instrument is your solution!

Hellma Education Raman Systems – Booth 66

Need a simple, robust system to teach Raman spectroscopy?  The Hellma Reva Educational Raman Instrument is your solution!

The Reva is a simple, sensitive Raman system that includes a MarqMetrix BallProbe® and pre-written lesson plans (including samples!) for easy implementation into your teaching curriculum.

The Reva also includes all critical components for laser safety and a robust software routine for spectral analysis.

Stop by and see the Reva at SciX

About SciX 2017, October 8-13, 2017 in Reno, NV

Leading researchers will convene to present their cutting edge developments in analytical sciences, instrumentation and unique applications.  The meeting hosts a world class exhibition, presentations from leading scientists, educational courses, and many networking opportunities.

Visit the website

Continue reading SciX 2017

ISTFA 2017

We are very excited to be going to Pasadena CA for ISTFA 2017. This is always a great show and we are looking forward to meeting with friends and making new ones.

We will be at booth #506 representing a number of products:

Micro Support

The Micro Support micro-manipulator with Electrode Holder details.


About ISFA 2017, November 5-9, Pasadena Convention Center

Plan today to attend ISTFA 2017! The 43rd International Symposium for Testing and Failure Analysis (ISTFA). This year’s theme is ‘Striving for 100% Success Rate’

Visit the website ISFA 2017

Luceo Fullauto StrainEye LSM-9000S

Luceo Fullauto StrainEye LSM-9000s

Fullauto StrainEye LSM-9000S is a fully automatic 2D-measuring device which measures retardation values and the direction of a slow axis in a transparent body having strain and birefringence therein. LSM-900s is equipped with 6 times optical zoom lens.

In order to measure direction and birefringence, conventionally the visual observation type polariscope using the Senarmont method is used. As well, our in-house manufactured product, Semiauto Senarmont which performs semi-automatic operations with the analyzer only manually rotated is also used.

The Senarmont method is an inspection method for measuring retardation quantitatively. An operator rotates the analyzer so that brightness of the part to be measured changes from the brightest state to darkest state, and measures its retardation by rotating the analyzer angularly. However, this conventional type has a problem such as the difference in decision of the brightness due to the difference in the condition during the measurement and also due to the difference in skill of each operator. Moreover, in Semiauto Senalmont, although the accuracy of measurement has improved from the visual observation type, the area to be measured is defined to the specific small portion in an image.

This Fullauto StrainEye makes it possible to start measuring immediately by only putting a sample on the polarizer. Therefore, retardation values and the direction of the slow axis can be measured easily. The measurement result is not influenced by each pixel of differences of personal skill. Not only a specific part is not subjected to the measurement but all of each pixel of a built-in CCD camera measures the entire detecting part. Since the direction of retardation and a slow axis are 2D-displayed on a monitor, those direction states are recognized immediately by the operator.

This instrument is suitable for measuring small samples since possible picture area is optionally variable from 60mm x 60mm to 10mm x 10mm based on being equipped with x6 magnification optical zoom lens for taking images.

This device is connected with a PC, and it is therefore feasible to save not only the measured data but also the observed image data easily.

With the use of super-luminescent LED as a light source, this detector is designed for long life and low power consumption. Accordingly maintenance and replacement of the light source as well as running costs can be reduced or dispensed with all together.


Size W200☓D280☓H595mm
Weight 11kg
Circulary polarizing plate size W70☓D70mm
Sample placement space height 0~70mm
Inspection Method Rotating analyzer method
Setting Wavelength 590nm
Repeat accrary σ=1nm
Measurement area size Varible (60×60~10×10mm)
Effective pixels 1100☓1100
Other Light Source:high-luminanceLED
PowerSorce:INPUT 100~240VAC 50/60Hz  OUTPUT 24VDC 1.5A
Accessory:Main body cover, AC Adapter (GS40A24-P1J)
The latest movie:H28 製品技術大賞歪検査器「フルオートストレインアイ」Movie Fullauto StrainEye LSM-9000LE

Micro Support Users Meeting – May 10, 2018

This workshop will bring together scientists from throughout the U.S. to share best practices in their micro-manipulation work.

Through this Workshop, users will learn about valuable techniques from others who practice the art and discuss future developments that will allow for extensions of their work/research.

Attendance at the Micro Support Users Meeting is Free

The event is a satellite meeting of the
2018 Advanced Photon Source | Center for Nanoscale Materials Users Meeting.  Main Meeting attendance is not required to join the Micro Support Users meeting.


For more information click here.

Or to register, please contact:

Steve Barnett
Barnett Technical Services
Phone: 916-897-2441