NIR Polariscopes

Top |Polariscopes | NIR Polariscopes | Polarizing & Wave Plates

NIR Polariscopes come in 2 versions LSM-9001NIR and the LSM 9100WNIR.


The LSM-9001NIR fully automatic polarimeter for low phase difference products such as semiconductor wafers. This remarkable new technology allows for stress inspection of previously impossible materials.

The Si disc is opaque to white light (left) but is clear to the NIR scan (right).

With the NIR instrument you can now look for stress in the following materials

  • Silicon Wafers
  • Silicon [Si]
  • Silicon Carbide[SiC]
  • Gallium Nitride [GaN]
  • Glass wafer
  • Transparent and colored resin products
  • Crystallized Quartz / Quartz / Optical crystals
LSM-9001NIR with operating computer


Inspection MethodNIR Rotating Analyzer Method
Measurement Range (approx.)0~150nm (Retardation)
Measurement area size (approx.)  50×50mm
Measurement object placement space (height)Max 160mm
SizeW300 ☓ D353 ☓ H540 mm
Weight22 kg
OthersLight Source:high-luminanceLED
PowerSorce:AC100~240V 50/60Hz DC input 24V 1.6A
Accessory:Main body cover
OS:Windows10 Pro (64bit) 


Enables quality control of colored resins
It is possible to evaluate strain distribution of colored resin products which were difficult to evaluate previously.

With the WNIR instrument you can now look for stress in the following materials

  • transparent resin product
  • colored resin product
  • resin film
  • resin sheet
  • crystal
  • quartz
  • optical crystal

The sample is limited to a object which are transmissive 900 1200nm wavelength of light.

LSM-9100W NIR scan of a plastic molded iPhone case
Model name Near Infrared Polariscope LSM-9100WNIR
Data Reportedretardation (nm), stress (MPa)
Measurement area(approx..) 100mm x 100mm
Wavelength of light source900 ~ 1,200 nm
Inspection methodNIR 3 wavelengths Linear Polarization Method
Size W300 × D 353 × H 540mm / 22kg

For More information

Luceo Strain Analyzers
Luceo Manufacturer Website

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