ISTFA 2017

We are very excited to be going to Pasadena CA for ISTFA 2017. This is always a great show and we are looking forward to meeting with friends and making new ones.

We will be at booth #506 representing a number of products:

Micro Support

The Micro Support micro-manipulator with Electrode Holder details.

 

About ISFA 2017, November 5-9, Pasadena Convention Center

Plan today to attend ISTFA 2017! The 43rd International Symposium for Testing and Failure Analysis (ISTFA). This year’s theme is ‘Striving for 100% Success Rate’

Visit the website ISFA 2017

Luceo Fullauto StrainEye LSM-9000S

Luceo Fullauto StrainEye LSM-9000s

Fullauto StrainEye LSM-9000S is a fully automatic 2D-measuring device which measures retardation values and the direction of a slow axis in a transparent body having strain and birefringence therein. LSM-900s is equipped with 6 times optical zoom lens.

In order to measure direction and birefringence, conventionally the visual observation type polariscope using the Senarmont method is used. As well, our in-house manufactured product, Semiauto Senarmont which performs semi-automatic operations with the analyzer only manually rotated is also used.

The Senarmont method is an inspection method for measuring retardation quantitatively. An operator rotates the analyzer so that brightness of the part to be measured changes from the brightest state to darkest state, and measures its retardation by rotating the analyzer angularly. However, this conventional type has a problem such as the difference in decision of the brightness due to the difference in the condition during the measurement and also due to the difference in skill of each operator. Moreover, in Semiauto Senalmont, although the accuracy of measurement has improved from the visual observation type, the area to be measured is defined to the specific small portion in an image.

This Fullauto StrainEye makes it possible to start measuring immediately by only putting a sample on the polarizer. Therefore, retardation values and the direction of the slow axis can be measured easily. The measurement result is not influenced by each pixel of differences of personal skill. Not only a specific part is not subjected to the measurement but all of each pixel of a built-in CCD camera measures the entire detecting part. Since the direction of retardation and a slow axis are 2D-displayed on a monitor, those direction states are recognized immediately by the operator.

This instrument is suitable for measuring small samples since possible picture area is optionally variable from 60mm x 60mm to 10mm x 10mm based on being equipped with x6 magnification optical zoom lens for taking images.

This device is connected with a PC, and it is therefore feasible to save not only the measured data but also the observed image data easily.

With the use of super-luminescent LED as a light source, this detector is designed for long life and low power consumption. Accordingly maintenance and replacement of the light source as well as running costs can be reduced or dispensed with all together.

Specification

Size W200☓D280☓H595mm
Weight 11kg
Circulary polarizing plate size W70☓D70mm
Sample placement space height 0~70mm
Inspection Method Rotating analyzer method
Setting Wavelength 590nm
Repeat accrary σ=1nm
Measurement area size Varible (60×60~10×10mm)
Effective pixels 1100☓1100
Other Light Source:high-luminanceLED
PowerSorce:INPUT 100~240VAC 50/60Hz  OUTPUT 24VDC 1.5A
Component:Mainbody,PC,Cables
Accessory:Main body cover, AC Adapter (GS40A24-P1J)
OS:Windows7(64bit)/Windows8.1(64bit)
The latest movie:H28 製品技術大賞歪検査器「フルオートストレインアイ」Movie Fullauto StrainEye LSM-9000LE

Micro Support Users Meeting – May 10, 2018

This workshop will bring together scientists from throughout the U.S. to share best practices in their micro-manipulation work.

Through this Workshop, users will learn about valuable techniques from others who practice the art and discuss future developments that will allow for extensions of their work/research.

Attendance at the Micro Support Users Meeting is Free

The event is a satellite meeting of the
2018 Advanced Photon Source | Center for Nanoscale Materials Users Meeting.  Main Meeting attendance is not required to join the Micro Support Users meeting.

 

For more information click here.

Or to register, please contact:

Steve Barnett
Barnett Technical Services
Phone: 916-897-2441
Email info@barnett-technical.com