Attolight manufactures the leading cathodoluminescence (CL) microscopes and accessories on the market. These systems have been used for a range of applications, including:
- Defect Visualization and Counting in Optoelectronic Materials
- GaN for Power Electronics
- Photovoltaic Materials
- Defects in Thin Film Battery Materials
- Semiconducting Diamond
Two types of systems are available:
Mönch STEM-CL Accessory
Power CL accessory for STEM systems. System offers a number of powerful features:
- Includes sub-micron XYZ motors on collection optics to optimize collection while sample is in position,
- Coupled to high-efficiency spectrometer for UV-Vis and near-IR detection,
- Fits within a 2 mm gap between pole pieces,
- Constant spectral resolution (no trade off with intensity),
- Compatible with most STEM techniques (including HAADF, BF, diffraction, EELS, or EDS),
- Compatible with Gatan Digital Micrograph
Optimized for Cathodoluminescence
Attolight’s entire system is optimized to achieve superior CL performance without compromising the scanning electron microscope specifications to provide the highest performance in CL measurement.
Attolight’s CL systems do not require any alignment. Attolight has developed the first Quantitative cathodo-luminescence system that allows for the comparison of spectra from different regions and samples to representative quantitative differences in your sample.
Cryogenic Nanopositioning Stage
The Attolight system can be configured with a cryogenic nanopositioning stage that provides temperature control from 8-300K with 1 nm accuracy and pivot-point precision that allows you to define a pivot point and have the same rotated about that point.
The Attolight system can easily be upgraded to include a range of external measurement systems and techniques including EDX, EBIC, micro-PL, and SEM-Raman spectroscopy.
Time-resolved CL may be used for lifetime and charge carrier dynamic measurements.
The electron optics within the Attolight system have been optimized for 10 ps pulsed operation – quick enough to elucidate manu common decay processes in semiconductor materials.