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Attolight

Attolight manufactures the leading cathodoluminescence (CL) microscopes and accessories on the market.  These systems have been used for a range of applications, including:

Two types of systems are available:


Mönch STEM-CL Accessory

Power CL accessory for STEM systems.  System offers a number of powerful features:

  • Includes sub-micron XYZ motors on collection optics to optimize collection while sample is in position,
  • Coupled to high-efficiency spectrometer for UV-Vis and near-IR detection,
  • Fits within a 2 mm gap between pole pieces,
  • Constant spectral resolution (no trade off with intensity),
  • Compatible with most STEM techniques (including HAADF, BF, diffraction, EELS, or EDS),
  • Compatible with Gatan Digital Micrograph


Monch STEM-CL Accessory


OPTIMIZED FOR CATHODOLUMINESCENCE

Attolight's entire system is optimized to achieve superior CL performance without compromising the scanning electron microscope specifications to provide the highest performance in CL measurement.



QUANTITATIVE CATHODOLUMINESCENCE

Attolight's CL systems do not require any alignment.  Attolight has developed the first Quantitative cathodo-luminescence system that allows for the comparison of spectra from different regions and samples to representative quantitative differences in your sample.

Attolight CL System
The Attolight Cathodoluminescence System
CRYOGENIC NANOPOSITIONING STAGE

The Attolight system can be configured with a cryogenic nanopositioning stage that provides temperature control from 8-300K with 1 nm accuracy and pivot-point precision that allows you to define a pivot point and have the same rotated about that point.

HIGH FLEXIBILITY

The Attolight system can easily be upgraded to include a range of external measurement systems and techniques including EDX, EBIC, micro-PL, and SEM-Raman spectroscopy.
Attolight GaN on Sapphire CL Image

Secondary electron and CL images of GaN on sapphire.  The CL image  shows threading disclocation defects (TDD) in GaN.
TIME-RESOLVED CATHODOLUMINESCENCE

Time-resolved CL may be used for lifetime and charge carrier dynamic measurements.

The electron optics within the Attolight system have been optimized for 10 ps pulsed operation - quick enough to elucidate manu common decay processes in semiconductor materials.
 


Attlight ZnO Nanobelt CL Image

Secondary electron and CL images of a ZnO nanobelt.  The CL image illustrates defects in the fine structure not observed in the SE image.  Time-resolved CL images revealed a decrease in the exciton non-radiative lifetime in the dark area (with the lowest CL band edge emission).


For more information on Attolight, please contact us.  You may also learn more by going to the Attolight web site.